01、引言
近十年，光伏組件PID（Potential Induced Degradation，電勢誘導衰減）效應導致組件功率大幅衰減的現象一直是業內人士關注的焦點，東莞市瑞凱環境檢測儀器有限公司是光伏組件PID測試設備——高溫高濕試驗箱生產廠家，也在不斷地對各種類型光伏組件的PID效應進行測試和研究，為光伏組件供應商提供更合理的PID測試解決方案。瑞凱儀器具有強大的PID測試設備研發能力，同時也提供潮濕滲透試驗設備，為客戶提供高效的測試服務。
02、什么是PID測(ce)試？
光伏組件PID測試是指在高溫高濕(shi)環(huan)境下（ 85℃和(he)85%RH ）給組件內部帶電(dian)(dian)(dian)(dian)(dian)(dian)體與(yu)邊框之(zhi)間施(shi)加等(deng)于組件系統額定電(dian)(dian)(dian)(dian)(dian)(dian)壓（±1000 V 或(huo) ±1500 V）的電(dian)(dian)(dian)(dian)(dian)(dian)壓偏(pian)差，當內部光伏電(dian)(dian)(dian)(dian)(dian)(dian)路相(xiang)對于地面(mian)為負(fu)偏(pian)壓時，框架(jia)和(he)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)之(zhi)間的電(dian)(dian)(dian)(dian)(dian)(dian)壓可導(dao)致玻(bo)(bo)璃中的鈉(na)離子向電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)表面(mian)漂移(yi)，電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)表面(mian)通常具(ju)有氮化(hua)硅（SiN）抗反射涂(tu)(tu)層，如果這(zhe)個涂(tu)(tu)層上的縫隙足夠(gou)大，允許鈉(na)離子進入(ru)(ru)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)或(huo)電(dian)(dian)(dian)(dian)(dian)(dian)荷流(liu)向玻(bo)(bo)璃，形成的漏電(dian)(dian)(dian)(dian)(dian)(dian)流(liu)就會通過邊框或(huo)安裝(zhuang)(zhuang)支架(jia)流(liu)入(ru)(ru)大地，從而出(chu)現(xian)PID效應。漏電(dian)(dian)(dian)(dian)(dian)(dian)流(liu)將(jiang)使電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)片(pian)的載流(liu)子及耗(hao)盡層狀態發生變化(hua)、電(dian)(dian)(dian)(dian)(dian)(dian)路中的接(jie)觸電(dian)(dian)(dian)(dian)(dian)(dian)阻和(he)封裝(zhuang)(zhuang)材料受到電(dian)(dian)(dian)(dian)(dian)(dian)化(hua)學腐(fu)蝕，出(chu)現(xian)電(dian)(dian)(dian)(dian)(dian)(dian)池(chi)片(pian)功率衰(shuai)減、串聯(lian)電(dian)(dian)(dian)(dian)(dian)(dian)阻增大、透光率降低、脫層等(deng)現(xian)象影(ying)響組件發電(dian)(dian)(dian)(dian)(dian)(dian)量及壽命。
圖1 PID效應的漏電(dian)流(liu)路徑
03、PID測(ce)試的必要性
PID效應對光伏組件的輸出功率影響巨大，是光伏電站發電量的“恐怖殺手”。因此，PID測試已成為光伏組件檢測項目中必不可少的項目之一。其標準IEC62804是由光伏組件性能測試標準IEC61215和光伏組件安全測試標準IEC61730結合而成，能夠很好的預判光伏組件在使用過程中是否會發生PID效應。瑞凱儀器高溫高濕試驗箱嚴格按照檢測標準開展測試，或應客戶要求進行加嚴PID測試。
圖2 PID測(ce)試(shi)流程圖
04、PID測試數據對比
迄今為止，東(dong)莞市瑞凱環(huan)境檢測(ce)儀器(qi)有限公(gong)司以服務光(guang)伏新能(neng)(neng)源(yuan)的(de)(de)(de)(de)企業有漢(han)能(neng)(neng)集團、東(dong)方日升新能(neng)(neng)源(yuan)、晶(jing)科能(neng)(neng)源(yuan)、弘(hong)晨光(guang)伏、帝龍(long)光(guang)電(dian)、新奧(ao)光(guang)伏等(deng)，高(gao)溫高(gao)濕試驗箱對各種工(gong)藝技術(shu)的(de)(de)(de)(de)光(guang)伏組件(jian)(jian)(jian)（雙面電(dian)池(chi)(chi)組件(jian)(jian)(jian)、大尺寸硅片(pian)(pian)組件(jian)(jian)(jian)、半片(pian)(pian)組件(jian)(jian)(jian)、疊瓦組件(jian)(jian)(jian)和其他高(gao)效電(dian)池(chi)(chi)技術(shu)的(de)(de)(de)(de)組件(jian)(jian)(jian)）均(jun)(jun)可做PID測(ce)試，測(ce)試的(de)(de)(de)(de)平均(jun)(jun)衰(shuai)減(jian)結果如(ru)下圖所示(shi)。
圖3 不同類(lei)型電(dian)池組件的PID測(ce)試對比
從圖示3中可以(yi)看出，無論哪種創新技術的(de)光伏組件，都(dou)存在(zai)不同程度(du)的(de)PID效應。
05、抗PID效應哪種組(zu)件更好？
另外(wai)，經過(guo)高(gao)溫高(gao)濕試(shi)驗箱(xiang)的(de)測試(shi)結果表明(ming)雙玻(bo)(bo)組(zu)件(jian)抗PID效應(ying)更好。隨機調取100片(pian)常規組(zu)件(jian)與(yu)雙玻(bo)(bo)組(zu)件(jian)數據，從統計的(de)數據中可(ke)以看出這100片(pian)雙玻(bo)(bo)組(zu)件(jian)平均衰減低于常規組(zu)件(jian)的(de)衰減。究(jiu)其原因主要(yao)是玻(bo)(bo)璃的(de)水蒸汽透(tou)過(guo)率幾乎為零，且雙玻(bo)(bo)組(zu)件(jian)沒(mei)有金屬邊框(kuang)不需(xu)要(yao)接地的(de)獨(du)特設計，在(zai)原理上就抑制了(le)PID產生的(de)可(ke)能。
圖4PID測試結(jie)果對比圖
06、結尾
光伏(fu)組(zu)(zu)件(jian)的(de)PID效應(ying)到(dao)目前(qian)為止(zhi)仍然(ran)存在(zai)，但隨著光伏(fu)產業(ye)的(de)發展，業(ye)界同仁對PID效應(ying)機理和PID效應(ying)的(de)對組(zu)(zu)件(jian)性能影響的(de)探索(suo)已逐步深入(ru)，相(xiang)信在(zai)不久的(de)將來PID效應(ying)將會得到(dao)徹(che)底(di)解決。
