表1列出了三個系列標準中溫度沖擊試驗的目的和應用對象。
1、試驗目(mu)的
三個(ge)系列標準(zhun)中(zhong)溫(wen)度沖擊(ji)試驗(yan)(yan)敘述的(de)(de)試驗(yan)(yan)目(mu)(mu)(mu)的(de)(de)是(shi)基本一(yi)(yi)致的(de)(de)，只是(shi)表達(da)方式(shi)(shi)略有區別(bie)。應(ying)當指出，這(zhe)種(zhong)表達(da)方式(shi)(shi)比較(jiao)含糊和(he)籠統。實(shi)際上溫(wen)度沖擊(ji)試驗(yan)(yan)作為一(yi)(yi)種(zhong)工(gong)具，應(ying)用在(zai)產(chan)品(pin)(pin)研(yan)制生產(chan)的(de)(de)不(bu)同(tong)的(de)(de)階段(duan)時的(de)(de)目(mu)(mu)(mu)的(de)(de)是(shi)不(bu)同(tong)的(de)(de)。工(gong)程研(yan)制階段(duan)可用于(yu)發現產(chan)品(pin)(pin)的(de)(de)設計和(he)工(gong)藝缺陷；產(chan)品(pin)(pin)定型或設計鑒定和(he)批產(chan)階段(duan)用于(yu)驗(yan)(yan)證(zheng)產(chan)品(pin)(pin)對溫(wen)度沖擊(ji)環(huan)境的(de)(de)適應(ying)性，為設計定型和(he)批產(chan)驗(yan)(yan)收決策提供依據；作為環(huan)境應(ying)力篩(shai)選(xuan)應(ying)用時，目(mu)(mu)(mu)的(de)(de)是(shi)剔除產(chan)品(pin)(pin)的(de)(de)早(zao)期(qi)故障，因(yin)此在(zai)編寫研(yan)制過程不(bu)同(tong)階段(duan)的(de)(de)環(huan)境試驗(yan)(yan)大綱或篩(shai)選(xuan)大綱，試驗(yan)(yan)報(bao)告或篩(shai)選(xuan)報(bao)告時，應(ying)將其(qi)目(mu)(mu)(mu)的(de)(de)的(de)(de)具體化(hua)，不(bu)宜象(xiang)表1中(zhong)的(de)(de)那(nei)樣壓縮地表述。
2、應用對象
三個(ge)系(xi)列標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)中(zhong)溫(wen)度(du)沖(chong)(chong)擊(ji)試(shi)(shi)(shi)(shi)驗(yan)(yan)的(de)(de)(de)應(ying)用(yong)(yong)(yong)產品層次略有(you)不同。GJB 150規定(ding)(ding)(ding)只適(shi)用(yong)(yong)(yong)于(yu)(yu)設(she)(she)備(bei)，而810F和(he)GB 2423中(zhong)規定(ding)(ding)(ding)可適(shi)用(yong)(yong)(yong)于(yu)(yu)元器(qi)件(jian)(jian)、部(bu)件(jian)(jian)、設(she)(she)備(bei)等(deng)各個(ge)組(zu)(zu)裝(zhuang)等(deng)級。CJB 150是(shi)以(yi)(yi)美(mei)軍標(biao)(biao)(biao)(biao)(biao)(biao)810C/D兩(liang)個(ge)版(ban)本為基礎制定(ding)(ding)(ding)的(de)(de)(de)，美(mei)軍標(biao)(biao)(biao)(biao)(biao)(biao)體(ti)(ti)系(xi)中(zhong)元器(qi)件(jian)(jian)溫(wen)度(du)沖(chong)(chong)擊(ji)試(shi)(shi)(shi)(shi)驗(yan)(yan)另(ling)有(you)單(dan)獨的(de)(de)(de)試(shi)(shi)(shi)(shi)驗(yan)(yan)標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)MIL- -STD- 202F《電工電子(zi)元器(qi)件(jian)(jian)環(huan)(huan)境試(shi)(shi)(shi)(shi)驗(yan)(yan)方法》。我(wo)國(guo)(guo)也以(yi)(yi)202F標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)為基礎制定(ding)(ding)(ding)了(le)我(wo)國(guo)(guo)的(de)(de)(de)電工電子(zi)元器(qi)件(jian)(jian)的(de)(de)(de)環(huan)(huan)境試(shi)(shi)(shi)(shi)驗(yan)(yan)方法標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)GJB 360《電工電子(zi)元器(qi)件(jian)(jian)環(huan)(huan)境試(shi)(shi)(shi)(shi)驗(yan)(yan)方法》，這(zhe)兩(liang)個(ge)標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)中(zhong)均有(you)溫(wen)度(du)沖(chong)(chong)擊(ji)試(shi)(shi)(shi)(shi)驗(yan)(yan)分標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)。因(yin)此(ci)，GJB150和(he)810C/D中(zhong)溫(wen)度(du)沖(chong)(chong)擊(ji)試(shi)(shi)(shi)(shi)驗(yan)(yan)應(ying)用(yong)(yong)(yong)產品僅限于(yu)(yu)設(she)(she)備(bei)。GB
2423系(xi) 列標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)屬于(yu)(yu)歐洲(zhou)電工委員(yuan)會(IEC)標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)的(de)(de)(de)體(ti)(ti)系(xi)，尚(shang)未發(fa)現(xian)該標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)體(ti)(ti)系(xi)中(zhong)單(dan)獨給出元器(qi)件(jian)(jian)的(de)(de)(de)環(huan)(huan)境試(shi)(shi)(shi)(shi)驗(yan)(yan)方法標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)，所以(yi)(yi)GB 2423適(shi)用(yong)(yong)(yong)于(yu)(yu)各個(ge)組(zu)(zu)裝(zhuang)等(deng)級產品的(de)(de)(de)規定(ding)(ding)(ding)有(you)一定(ding)(ding)(ding)的(de)(de)(de)合(he)理性。然而810F中(zhong)規定(ding)(ding)(ding)也適(shi)用(yong)(yong)(yong)于(yu)(yu)元部(bu)件(jian)(jian)規定(ding)(ding)(ding)，是(shi)與202F標(biao)(biao)(biao)(biao)(biao)(biao)準(zhun)(zhun)(zhun)相(xiang)矛盾的(de)(de)(de)，不夠合(he)理，目前沒有(you)見到如此(ci)規定(ding)(ding)(ding)的(de)(de)(de)說(shuo)明。
3、應用介質
GJB 150和810F的(de)(de)溫度(du)沖擊試(shi)驗(yan)中規定(ding)使用的(de)(de)介(jie)(jie)質(zhi)(zhi)(zhi)限于空氣，而(er)GB 2423溫度(du)變(bian)化試(shi)驗(yan)中的(de)(de)，Na、Nb使用的(de)(de)介(jie)(jie)質(zhi)(zhi)(zhi)也為空氣。Nc試(shi)驗(yan)使用的(de)(de)介(jie)(jie)質(zhi)(zhi)(zhi)是液(ye)體(ti)。使用什么樣的(de)(de)介(jie)(jie)質(zhi)(zhi)(zhi)主要取(qu)決于產(chan)品實際壽命期內遇(yu)到的(de)(de)介(jie)(jie)質(zhi)(zhi)(zhi)類型(xing)。顯然使用液(ye)體(ti)作(zuo)為介(jie)(jie)質(zhi)(zhi)(zhi)進行的(de)(de)溫度(du)沖擊試(shi)驗(yan)更為嚴(yan)酷。
